SN74LVTH18502APMG4
IC SCAN-TEST-DEV/XCVR 64-LQFPManufacturer: Texas Instruments
Categories: Universal Bus Functions
Quality Control: Learn More
Texas Instruments SN74LVTH18502APMG4. This ABT Scan Test Device with Universal Bus Transceivers offers a 64-LQFP package with a 10x10mm footprint. Operating within a temperature range of -40°C to 85°C, this surface-mount component is designed for robust performance. The 74LVTH series device integrates scan-test functionality with universal bus transceivers, making it suitable for complex digital system designs. It is commonly utilized in telecommunications, industrial automation, and computing applications where high-speed data transfer and diagnostic capabilities are critical. Packaged in trays, this component facilitates efficient integration into manufacturing processes.
Additional Information
Series: 74LVTHRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TrayDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tray |
| Package / Case | 64-LQFP |
| Mounting Type | Surface Mount |
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Operating Temperature | -40°C ~ 85°C |
| Supplier Device Package | 64-LQFP (10x10) |
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