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SNJ54BCT8244AJT

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SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUF

Manufacturer: Texas Instruments

Categories: Specialty Logic

Quality Control: Learn More

Scan Test Device with Buffers IC 24-CDIP

Additional Information

Series: 54BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ActivePackaging: TubeDatasheet:
Technical Details:
PackagingTube
Package / Case24-CDIP (0.300"", 7.62mm)
Mounting TypeThrough Hole
Number of Bits8
Logic TypeScan Test Device with Buffers
Operating Temperature-55°C ~ 125°C
Supply Voltage4.5V ~ 5.5V
Supplier Device Package24-CDIP

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