SN74BCT8374ANT
IC SCAN TEST DEVICE W/FF 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8374ANT is an 8-bit, edge-triggered D-type flip-flop device within the 74BCT series, designed for scan-path testing applications. This through-hole component, packaged in a 24-PDIP, features a logic type that supports scan test functionality. The device operates with a supply voltage range of 4.5V to 5.5V and is rated for an operating temperature of 0°C to 70°C. Its 24-DIP (0.300", 7.62mm) package is suitable for traditional PCB assembly. This component finds application in areas requiring advanced testability and design-for-test (DFT) methodologies within digital system design.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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