SN74BCT8374ADWRG4
IC SCAN TEST DEVICE 24SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8374ADWRG4 is an 8-bit, edge-triggered D-type flip-flop designed as a scan test device. This component belongs to the 74BCT series and is housed in a 24-SOIC package, suitable for surface mount applications. The device features a 4.5V to 5.5V supply voltage range and operates within a temperature range of 0°C to 70°C. Its architecture supports efficient boundary-scan testing, making it integral to automated test equipment (ATE) and design-for-test (DFT) methodologies. Applications for this component are found in telecommunications, industrial automation, and automotive electronics where robust testing and high-speed digital signal processing are critical. The SN74BCT8374ADWRG4 is supplied on tape and reel (TR).
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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