SN74BCT8374ADWR
IC SCAN TEST DEVICE W/FF 24-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8374ADWR, a member of the 74BCT series, is an advanced scan test device featuring eight edge-triggered D-type flip-flops. This highly integrated component facilitates efficient test pattern application and data capture within complex digital systems. Designed for surface-mount applications, it is provided in a 24-SOIC package, supplied on tape and reel for automated assembly. The device operates within a supply voltage range of 4.5V to 5.5V and functions across an ambient temperature range of 0°C to 70°C. Its robust architecture makes it suitable for applications in telecommunications, industrial automation, and consumer electronics, where sophisticated testability and high-speed data handling are critical requirements.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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