SN74BCT8374ADW
IC SCAN TEST DEVICE W/FF 24-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: 6 week(s)Product Status: ActivePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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