SN74BCT8373ANT
IC SCAN TEST DEVICE LATCH 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8373ANT is an advanced scan test device featuring eight D-type latches. This component, part of the 74BCT series, is designed for through-hole mounting and comes in a 24-DIP package. The SN74BCT8373ANT operates with a supply voltage range of 4.5V to 5.5V and functions within an ambient temperature range of 0°C to 70°C. Its robust design makes it suitable for applications in the telecommunications and industrial automation sectors, where reliable test and diagnostic capabilities are paramount. The 24-PDIP packaging facilitates straightforward integration into existing PCB designs.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Latches |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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