SN74BCT8373ADWRG4
IC SCAN TEST DEVICE 24SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8373ADWRG4 is an 8-bit, D-type latch scan test device from the 74BCT series. This surface-mount component is supplied in a 24-SOIC package, measuring 7.50mm in width, and is delivered on tape and reel. Featuring a logic type designed for scan testing, it integrates D-type latches for efficient data capture and manipulation within complex digital systems. The device operates with a supply voltage range of 4.5V to 5.5V and has an operating temperature range of 0°C to 70°C. Its advanced scan test capabilities are utilized in various industries including telecommunications, industrial automation, and computing, where robust testing and diagnostics are critical for system reliability and performance.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Latches |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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