SN74BCT8373ADWR
IC SCAN TEST DEVICE LATCH 24SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8373ADWR is an 8-bit, Scan Test Device featuring D-type latches. This component, part of the 74BCT series, is housed in a 24-SOIC package and designed for surface-mount applications. It operates with a supply voltage range of 4.5V to 5.5V and has an operating temperature range of 0°C to 70°C. The SN74BCT8373ADWR is supplied on tape and reel for efficient manufacturing processes. Its architecture is optimized for scan testing methodologies, making it suitable for board-level testability and in-system diagnostics within telecommunications and industrial automation sectors.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Latches |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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