SN74BCT8245ANT
IC SCAN TEST DEVICE TXRX 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8245ANT is an 8-bit, bi-directional bus transceiver with integrated scan test capabilities. This component from the 74BCT series is housed in a 24-pin Dual In-line Package (DIP) for through-hole mounting. Designed for robust operation, it supports a supply voltage range of 4.5V to 5.5V and operates within a temperature range of 0°C to 70°C. The SN74BCT8245ANT is engineered for applications requiring efficient bus interfacing coupled with on-chip testability, commonly found in telecommunications and computing systems. Its scan test functionality facilitates enhanced diagnostics and test access within complex digital designs. The device is supplied in a tube package.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Bus Transceivers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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