SN74BCT8245ADW
IC SCAN TEST DEVICE TXRX 24-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8245ADW, a 74BCT series device, is a high-speed scan test device featuring eight non-inverting bus transceivers. This 24-SOIC surface-mount component is designed for applications requiring robust bus interfacing and built-in testability. The device operates with a supply voltage range of 4.5V to 5.5V and maintains functionality across an operating temperature range of 0°C to 70°C. Its 24-SOIC (0.295", 7.50mm width) package is suitable for automated assembly processes. The SN74BCT8245ADW is commonly found in advanced computing systems, telecommunications infrastructure, and industrial control systems where efficient data transfer and comprehensive testing capabilities are paramount.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: BulkDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Bulk |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Bus Transceivers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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