SN74BCT8244ANTG4
IC SCAN TEST DEVICE BUFF 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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The Texas Instruments SN74BCT8244ANTG4 is a 74BCT series scan test device featuring 8-bit buffers. This through-hole component, packaged in a 24-PDIP with a 0.300" width, operates within a supply voltage range of 4.5V to 5.5V and a temperature range of 0°C to 70°C. Its logic type classifies it as a scan test device with buffers, making it suitable for applications in the telecommunications and industrial automation sectors where robust testability and signal buffering are critical. The device is supplied in tube packaging.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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