SN74BCT8244ANT
IC SCAN TEST DEVICE BUFF 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8244ANT is a 74BCT series scan test device featuring eight non-inverting buffers. This through-hole component, packaged in a 24-DIP (0.300" width), operates with a supply voltage range of 4.5V to 5.5V and an operating temperature from 0°C to 70°C. Designed for applications requiring advanced testability, this electronic component is commonly utilized in telecommunications, industrial automation, and consumer electronics sectors for its ability to facilitate scan-chain testing and improve manufacturing test efficiency. The SN74BCT8244ANT provides robust buffering with its 8-bit architecture, making it suitable for complex board-level testing and system diagnostics.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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