SN74BCT8244ADWR
IC SCAN TEST DEVICE BUFF 24-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
Quality Control: Learn More
The Texas Instruments SN74BCT8244ADWR is an octal buffer/line driver from the 74BCT series, designed for scan-testable applications. This device features eight independent buffers with 3-state outputs, enabling efficient control of signal propagation. The 24-SOIC package, with its 7.50mm width, facilitates surface mounting in compact designs. Operating within a supply voltage range of 4.5V to 5.5V and an ambient temperature range of 0°C to 70°C, this component is suitable for a variety of demanding environments. Its scan-test architecture is particularly beneficial in the telecommunications, industrial automation, and computing industries for facilitating built-in self-test (BIST) capabilities and improving manufacturing test efficiency. The SN74BCT8244ADWR is supplied on tape and reel for automated assembly processes.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: DiscontinuedPackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
Request a Quote
Clients Also Buy
SN74BCT760DWR
IC BUF NON-INVERT 5.5V 20SOIC
SN74BCT756DW
IC BUFFER INVERT 5.5V 20SOIC
SN74BCT541AN
IC BUF NON-INVERT 5.5V 20DIP
