SN74BCT8240ANT
IC SCAN TEST DEVICE BUFF 24-DIPManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8240ANT is a 74BCT series scan test device featuring 8 inverting buffers. This electronic component is housed in a 24-PDIP through-hole package, with a standard 0.300" (7.62mm) pin pitch, supplied in tube packaging. It operates across a supply voltage range of 4.5V to 5.5V and functions within an ambient temperature range of 0°C to 70°C. The SN74BCT8240ANT is utilized in applications requiring advanced testability and signal integrity, commonly found in industrial automation and communications infrastructure.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: TubeDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tube |
| Package / Case | 24-DIP (0.300"", 7.62mm) |
| Mounting Type | Through Hole |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Inverting Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-PDIP |
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