SN74BCT8240ADWRG4
IC SCAN TEST DEVICE 24SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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The Texas Instruments SN74BCT8240ADWRG4 is a BCT series scan test device featuring eight inverting buffers. This device is designed for surface mount applications on a 24-SOIC (0.295", 7.50mm Width) package, supplied in Tape & Reel (TR). Operating with a supply voltage range of 4.5V to 5.5V, it functions across an ambient temperature range of 0°C to 70°C. This component is integral to test and diagnostic functions within telecommunications, industrial automation, and consumer electronics sectors.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Inverting Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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