SN74BCT8240ADWR
IC SCAN TEST DEVICE BUFF 24-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74BCT8240ADWR is an 8-bit, octal buffer/line driver featuring scan test capability with inverting buffers. This component from the 74BCT series is housed in a 24-SOIC package, suitable for surface mounting via tape and reel. Designed for operation within a supply voltage range of 4.5V to 5.5V and an operating temperature of 0°C to 70°C, it offers robust performance in demanding applications. The device facilitates efficient testing and diagnostics within complex digital systems. Its functionality is leveraged across various industries including telecommunications, industrial automation, and consumer electronics where reliable signal buffering and test access are critical.
Additional Information
Series: 74BCTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Inverting Buffers |
| Operating Temperature | 0°C ~ 70°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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