SN74ABT8952DWR
IC SCAN TEST DEVICE 28SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74ABT8952DWR is an 8-bit, dual-bus registered transceiver with scan test capability from the 74ABT series. This surface-mount device, housed in a 28-SOIC package, facilitates bidirectional data flow with registered inputs and outputs. Its scan test functionality, a key feature for design verification and production testing, integrates seamlessly into automated test equipment (ATE) environments. Operating with a supply voltage range of 4.5V to 5.5V and an industrial operating temperature range from -40°C to 85°C, the SN74ABT8952DWR is suitable for applications in telecommunications, industrial automation, and consumer electronics where robust testing and reliable data transfer are critical. The component is supplied on tape and reel.
Additional Information
Series: 74ABTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 28-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Registered Bus Transceiver |
| Operating Temperature | -40°C ~ 85°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 28-SOIC |
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