SN74ABT8646DWR
IC SCAN TEST DEVICE 28-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74ABT8646DWR is an 8-bit, dual-supply, bus transceiver with 3-state outputs and integrated scan test circuitry. This device from the 74ABT series offers a robust solution for advanced system testing and diagnostics. Featuring bi-directional bus operation, it supports independent control of the two data ports, making it suitable for complex bus interfacing. The integrated scan test capability facilitates in-system testability and fault isolation. Its 28-SOIC package, designed for surface mounting, ensures efficient board space utilization. Operating across a supply voltage range of 4.5V to 5.5V and an industrial temperature range of -40°C to 85°C, this component is well-suited for applications in telecommunications, industrial automation, and high-performance computing where reliable data transfer and testability are critical.
Additional Information
Series: 74ABTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 28-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Bus Transceiver and Registers |
| Operating Temperature | -40°C ~ 85°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 28-SOIC |
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