SN74ABT8543DWR
IC SCAN TEST DEVICE 28-SOICManufacturer: Texas Instruments
Categories: Specialty Logic
Quality Control: Learn More
Texas Instruments' SN74ABT8543DWR is an 8-bit registered bus transceiver featuring scan test capabilities. This component, part of the 74ABT series, is housed in a 28-SOIC (0.295", 7.50mm width) surface-mount package. It operates within a supply voltage range of 4.5V to 5.5V and is specified for an operating temperature range of -40°C to 85°C. The SN74ABT8543DWR is designed for applications requiring complex scan-chain testing and high-speed data transmission. Its registered architecture ensures data integrity during bus operations. This device is commonly utilized in telecommunications, industrial automation, and advanced computing systems where robust testability and efficient data handling are critical. The component is supplied on tape and reel for automated assembly processes.
Additional Information
Series: 74ABTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 28-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Registered Bus Transceiver |
| Operating Temperature | -40°C ~ 85°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 28-SOIC |
Request a Quote
Clients Also Buy
SN74ABT245BPWR
IC TXRX NON-INVERT 5.5V 20TSSOP
SN74ABT16245ADGGR
IC TXRX NON-INVERT 5.5V 48TSSOP
74ABT125D,623
IC BUFF NON-INVERT 5.5V 14SO
