SN74ABT8245DWG4
IC SCAN TEST DEVICE 24SOICManufacturer: Texas Instruments
Categories: Specialty Logic
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Texas Instruments SN74ABT8245DWG4, a 74ABT series scan test device with bus transceivers, is designed for advanced digital system testing and diagnostics. This 8-bit, bi-directional transceiver offers robust bus interface capabilities coupled with integrated scan test functionality. The device operates within a supply voltage range of 4.5V to 5.5V, with an operating temperature range of -40°C to 85°C, making it suitable for demanding industrial and automotive applications. Packaged in a 24-SOIC (0.295", 7.50mm width) for surface mounting, the SN74ABT8245DWG4 facilitates efficient board layout and assembly. Its logic type, a scan test device with bus transceivers, is crucial for in-circuit testing and design verification in complex electronic systems.
Additional Information
Series: 74ABTRoHS Status: ROHS3 CompliantManufacturer Lead Time: No lead time information availableProduct Status: DiscontinuedPackaging: BulkDatasheet:Download Free CAD Model:
Technical Details:
| Packaging | Bulk |
| Package / Case | 24-SOIC (0.295"", 7.50mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with Bus Transceivers |
| Operating Temperature | -40°C ~ 85°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 24-SOIC |
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