8V182512IDGGREP
IC ABT SCAN TEST DEV3.3V 64TSSOPManufacturer: Texas Instruments
Categories: Specialty Logic
Quality Control: Learn More
ABT Scan Test Device With Universal Bus Transceivers IC 64-TSSOP
Additional Information
Series: -RoHS Status: ROHS3 CompliantManufacturer Lead Time: 18 week(s)Product Status: ActivePackaging: Tape & Reel (TR)Datasheet:Download Free CAD Model:
Technical Details:
| Packaging | Tape & Reel (TR) |
| Package / Case | 64-TFSOP (0.240"", 6.10mm Width) |
| Mounting Type | Surface Mount |
| Number of Bits | 18 |
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Operating Temperature | -40°C ~ 85°C |
| Supply Voltage | 2.7V ~ 3.6V |
| Supplier Device Package | 64-TSSOP |
Request a Quote
Clients Also Buy
SN74FB1653PCA
IC 17BIT UNIV STRG XCVR 100HLQFP
SN74SSTV32852GKFR
IC BUFFER 24BIT-48BIT 114LFBGA
SN74LVTH182646APM
IC SCAN-TEST-DEV/XCVR 64-LQFP
