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TL431KLP-AP

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TL431KLP-AP

IC VREF SHUNT 36V TO92

Manufacturer: Micro Commercial Co

Categories: Voltage Reference

Quality Control: Learn More

Micro Commercial Co TL431KLP-AP is a programmable shunt voltage reference IC. This device offers a precise and adjustable output voltage ranging from 2.5V to 36V, with a typical cathode current of 1 mA and a maximum output current of 100 mA. The TL431KLP-AP is housed in a TO-92 package (TO-226-3, TO-92-3) with formed leads, suitable for through-hole mounting. It operates within an ambient temperature range of -40°C to 85°C. This component is commonly utilized in power supply regulation, battery charging circuits, and general voltage regulation applications across various industrial and consumer electronics sectors. The packaging is provided in Tape & Box (TB).

Additional Information

Series: -RoHS Status: RoHS CompliantManufacturer Lead Time: No lead time information availableProduct Status: ObsoletePackaging: Tape & Box (TB)
Technical Details:
Tolerance-
PackagingTape & Box (TB)
Package / CaseTO-226-3, TO-92-3 (TO-226AA) Formed Leads
Temperature Coefficient-
Output TypeProgrammable
Mounting TypeThrough Hole
Voltage - Input2.482V ~ 37V
Reference TypeShunt
Operating Temperature-40°C ~ 85°C (TJ)
Current - Supply-
Supplier Device PackageTO-92
Voltage - Output (Min/Fixed)2.5V
Noise - 0.1Hz to 10Hz-
Noise - 10Hz to 10kHz-
Current - Cathode1 mA
Current - Output100 mA
Voltage - Output (Max)36 V

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An integrated circuit (IC) is a semiconductor chip that contains transistors, resistors, capacitors, and other electronic components on a single silicon substrate. ICs are the foundation of modern electronics and power devices such as smartphones, computers, automotive systems, and industrial equipment.

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We partner with industry-leading AS6171 & AS6081-certified third party testing labs to mitigate risk and support a wide array of end uses for your company’s requirements. Testing includes but isn’t limited to: Decapsulation & Internal Dye Verification. X-Ray Inspection & Analysis, External Visual Inspection, Surface Texture Analysis (SEM), and Electrical Pin Correlation.